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VLSI testing / Ed. by T.W. Williams.

Contributor(s): Williams, T. W, 1943- [edt]Material type: Text

TextLanguage: English Series: Advances in CAD for VLSI ; Vol. 5Publication details: Amsterdam ; New York : New York, N.Y., U.S.A. : North-Holland ; Sole distributors for the U.S.A. and Canada, Elsevier Science Publ. Co., 1986Description: ix, 275 p. : ill. ; 25 cmISBN: 0444878955 (U.S.)Subject(s): Integrated circuits -- Very large scale integration -- TestingDDC classification: 621.395

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Holdings
Item type	Current library	Collection	Call number	Status	Notes	Date due	Barcode
Գրքեր/Books	Fundamental Scientific Library	Gulbenkian Individual Collection	Gulb/7050 (Browse shelf(Opens below))	Available	ILL Non-Circ.		FL0084729

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