Рентгенодифракционная диагностика субмикронных слоев / А.М. Афанасьев, П.А. Александров, Р.М. Имамов.
Material type:
TextLanguage: Russian Publication details: Москва : Наука. Гл. ред. физ.-мат. лит., 1989Description: 151 с. ; 22 смISBN: 5020140201Subject(s): Рентгеновские лучи -- Дифракция на кристаллах | Рентгеноструктурный анализ
| Item type | Current library | Collection | Call number | Status | Notes | Date due | Barcode |
|---|---|---|---|---|---|---|---|
Գրքեր/Books
|
Fundamental Scientific Library | General | PII/609830 (Browse shelf(Opens below)) | Available | 30 Days Loan | 120609830 | |
|
Գրքեր/Books
|
Fundamental Scientific Library | General | PII/616854 (Browse shelf(Opens below)) | Available | 30 Days Loan | 120616854 |
Библиогр.: с. 146-151
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