TY  - BOOK
AU  - Williams,T.W.
TI  - VLSI testing
SN  - 0444878955 (U.S.)
U1  - 621.395 19
PY  - 1986///
CY  - Amsterdam, New York, New York, N.Y., U.S.A.
PB  - North-Holland, Sole distributors for the U.S.A. and Canada, Elsevier Science Publ. Co.
KW  - Integrated circuits
KW  - Very large scale integration
KW  - Testing
N1  - Includes bibliographies
ER  -