VLSI testing / 
Ed. by T.W. Williams. 
 - Amsterdam ;  New York :  New York, N.Y., U.S.A. :  North-Holland ;  Sole distributors for the U.S.A. and Canada, Elsevier Science Publ. Co.,  1986. 
 - ix, 275 p. :  ill. ;  25 cm. 
 - Advances in CAD for VLSI  Vol. 5 .
<br/><br/>Includes bibliographies. 
<br/><br/><label>ISBN: </label>0444878955 (U.S.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--Very large scale integration--Testing.
<br/><br/><label>Dewey Class. No.: </label>621.395