Uncertainty in artificial intelligence 2 /
Ed. by John F. Lemmer and Laveen N. Kanal.
- Amsterdam ; New York : New York, N.Y., U.S.A. : North-Holland ; Sole distributors for the U.S.A. and Canada, Elsevier Science Publ., 1986-.
- v. : ill. ; 23 cm.
- Machine intelligence and pattern recognition Vol. 5 .