EXAFS : Basic principles and data analysis / Boon K. Teo.
Material type:
TextLanguage: English Series: Inorganic chemistry concepts ; Vol. 9Publication details: Berlin ; New York : Springer-Verlag, 1986Description: xviii, 349 p. : ill. ; 25 cmISBN: 3540158332; 0387158332 (U.S.)Subject(s): Extended X-ray absorption fine structureDDC classification: 539.7/222
| Item type | Current library | Collection | Call number | Status | Notes | Date due | Barcode |
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Fundamental Scientific Library | Gulbenkian Individual Collection | Gulb/7205 (Browse shelf(Opens below)) | Available | ILL Non-Circ. | FL0090708 |
Includes index.
Bibliogr.: p. [223]-284.
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